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Electron Transfer Initiated Formation of Covalently Bound Organic Layers on Silicon Surfaces

机译:电子转移引发的硅表面上共价键合有机层的形成

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摘要

An electron transfer initiated organic modification of silicon surfaces, using a donor/acceptor pair of ferrocene (Fc) and N-bromosuccinimide (NBS) (or N-bromoph-thalimide (NBP)), is reported for the first time. This modification method is efficient and does not require the use of heat or irradiation. Multilayer structures are formed on the surfaces through radical reactions, similar to the reduction of aryl diazonium salts. The modified surfaces were characterized by infrared reflection—absorption spectroscopy (IRRAS), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM). IRRAS spectra clearly indicate a strong carbonyl stretch and the presence of a ferrocene moiety for each of the modified surfaces. XPS data show the presence of all elements from the donor/acceptor pair and provide strong evidence that the samples can be further modified by nucleophilic substitution. AFM imaging indicates the formation of dense layers that can be scratched away to reveal depth information on approximately 2 nm and the underlying terraces of the silicon substrate. A mechanism is proposed where radical abstraction of a surface hydrogen takes place leading to the formation of a covalently bound imidyl group, which is followed by the formation of polymeric structures through radical chain reactions.
机译:首次报道了使用二茂铁(Fc)和N-溴琥珀酰亚胺(NBS)(或N-溴邻苯二甲酰亚胺(NBP))的供体/受体对进行的电子转移引发的硅表面有机改性。该修改方法是有效的,并且不需要使用热或辐射。多层结构通过自由基反应在表面形成,类似于芳基重氮盐的还原。改性表面的特征在于红外反射吸收光谱(IRRAS),X射线光电子能谱(XPS)和原子力显微镜(AFM)。 IRRAS光谱清楚地表明每个修饰表面均具有很强的羰基伸展性和二茂铁部分的存在。 XPS数据显示了来自供体/受体对的所有元素的存在,并提供了有力的证据表明可以通过亲核取代进一步修饰样品。 AFM成像表明形成了致密层,可以将其刮掉以显示大约2 nm的深度信息以及硅基板的下层平台。提出了一种机制,其中发生表面氢的自由基提取,导致形成共价键合的酰亚胺基,然后通过自由基链反应形成聚合物结构。

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