首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Influence of Sn and Cr Doping on Morphology and Luminescence of Thermally Grown Ga2O3 Nanowires
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Influence of Sn and Cr Doping on Morphology and Luminescence of Thermally Grown Ga2O3 Nanowires

机译:Sn和Cr掺杂对热生长Ga2O3纳米线形貌和发光的影响

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摘要

Elongated micro- and nanostructures of Sn doped or Sn and Cr codoped monoclinic gallium oxide have been grown by a thermal method. The presence of Sn during growth has been shown to strongly influence the morphology of the resulting structures, including Sn doped branched wires, whips, and needles. Subsequent codoping with Cr is achieved through thermal diffusion for photonic purposes. The formation mechanism of the branched structures has been studied by transmission electron microscopy (TEM). Epitaxial growth has been demonstrated in some cases, revealed by a very high quality interface between the central rod and the branches of the structures, while in other cases, formation of extended defects such as twins has been observed in the interface region. The influence of dopants on the energy levels of Ga and O within the structures has been studied by XPS. Micro-Raman spectroscopy was used to assess the influence of Sn doping, and Sn-Cr codoping, on the vibrational properties of single nanowires. Cathodoluminescence (CL) measurements show a Sn-related complex band in the Sn-doped structures. Temperature-dependent and excitation-density-dependent CL indicates that this is a thermally activated emission. In the Sn- Cr codoped samples, the characteristic, very intense Cr~(3+) red luminescence emission quenches the bands observed in the Sn-doped samples. Branched, Sn-Cr codoped structures were studied with microphotoluminescence imaging and spectroscopy, and waveguiding behavior was observed along the trunks and branches of these structures.
机译:锡的掺杂或锡和铬共掺杂的单斜晶镓的微结构和纳米结构已经通过热法生长。已显示生长过程中Sn的存在会严重影响所得结构的形态,包括Sn掺杂的分支线,鞭和针。随后通过光子目的的热扩散实现与Cr的共掺杂。通过透射电子显微镜(TEM)研究了支链结构的形成机理。外延生长在某些情况下已得到证明,这是通过中心杆与结构分支之间的高质量界面揭示的,而在其他情况下,已在界面区域观察到延伸缺陷的形成,例如孪晶。 XPS研究了掺杂剂对结构中Ga和O能级的影响。显微拉曼光谱法用于评估Sn掺杂和Sn-Cr共掺杂对单根纳米线振动特性的影响。阴极发光(CL)测量显示在Sn掺杂的结构中Sn相关的复杂带。取决于温度和取决于激发密度的CL表示这是热激活的发射。在Sn-Cr共掺杂的样品中,特征性的非常强的Cr〜(3+)红色发光发射猝灭了在Sn-掺杂的样品中观察到的谱带。用微光致发光成像和光谱研究了分支的Sn-Cr共掺杂结构,并在这些结构的主干和分支上观察到了波导行为。

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