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Theoretical analysis of initial adsorption of high-κ metal oxides on In_x Ga_(1-x) As (0 0 1) - (4×2) surfaces

机译:高κ金属氧化物在In_x Ga_(1-x)As(0 0 1)-(4×2)表面上初始吸附的理论分析

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摘要

Ordered, low coverage to monolayer, high- κ oxide adsorption on group III rich InAs (0 0 1) - (4×2) and In_(0.53)Ga_(0.47) As (0 0 1) - (4×2) was modeled via density functional theory (DFT). Initial adsorption of HfO_2 and ZrO_2 was found to remove dangling bonds on the clean surface. At full monolayer coverage, the oxide-semiconductor bonds restore the substrate surface atoms to a more bulklike bonding structure via covalent bonding, with the potential for an unpinned interface. DFT models of ordered HfO_2 / In_(0.53)Ga_(0.47)As (0 0 1) - (4×2) show it fully unpins the Fermi level.
机译:在富第III组的InAs(0 0 1)-(4×2)和In_(0.53)Ga_(0.47)As(0 0 1)-(4×2)上有序的,低覆盖率的单层高κ氧化物吸附通过密度泛函理论(DFT)进行建模。发现最初吸附HfO_2和ZrO_2可以去除干净表面上的悬空键。在完全单层覆盖下,氧化物-半导体键通过共价键将衬底表面原子还原为更块状的键结构,并具有未固定界面的潜力。有序HfO_2 / In_(0.53)Ga_(0.47)As(0 0 1)-(4×2)的DFT模型显示,它完全释放了费米能级。

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