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The study of surface segregation of Re3Pt polycrystalline alloy with photoelectron spectroscopy

机译:Re3Pt多晶合金表面偏析的光电子能谱研究

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摘要

The surface segregation and electronic structure of Re3Pt polycrystalline alloy were investigated via x-ray photoelectron spectroscopy (XPS). The results from angle-resolved core-level XPS show the enrichment of Pt at the top surface layer upon annealing at T=1200 K. The experimental results show excellent agreement with a theoretical model calculation, providing the element-specific depth profiles upon the high temperature annealing process. The presence of strong electron hybridization between Re and Pt is evident in the valence-band density-of-states ultraviolet photoemission spectra.
机译:通过X射线光电子能谱(XPS)研究了Re3Pt多晶合金的表面偏析和电子结构。角分辨核心能级XPS的结果表明,在T = 1200 K退火时,顶层表面的Pt富集。实验结果与理论模型计算非常吻合,在高温下提供了特定于元素的深度分布温度退火工艺。 Re和Pt之间强电子杂交的存在在价带态密度紫外光发射光谱中是明显的。

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