The deposition angle-dependent density of amorphous solid water films

摘要

The index of refraction and thickness of amorphous solid water (ASW) films are determined using laser optical interferometry. From the film thickness, the density of ASW can be calculated directly since the molecular beam flux and the H_2O condensation coefficient are both known. From the index of refraction the ASW density can also be determined using the Lorentz-Lorenz relationship. The densities determined via both methods agree within experimental uncertainty. For films deposited at 22 K using a collimated molecular beam, the index of refraction and density decrease monotonically as the deposition angle is varied from normal to oblique incidence. At normal incidence the films have an index of refraction of 1.285 and are presumed to be fully dense (0.94 g/cm~3). At glancing incidence (86 deg) the film has a refractive index of 10.5 and a density of 0.16 g/cm~3, indicating a porosity exceeding 80%. The angle-dependent film density is in semiquantitative agreement with the results of ballistic deposition simulations of ASW film growth.