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Mapping the xenon (e ,2e) differential cross section from coplanar to perpendicular geometries

机译:从共面几何到垂直几何映射氙(e,2e)微分截面

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摘要

Differential cross sections for xenon are presented for low-energy (e,2e) measurements under doubly symmetric kinematics, for incident energies between 5 and 40 eV above the ionization threshold. A range of geometries were investigated from coplanar through to the perpendicular plane, with the outgoing electrons having equal energies and angles. The cross sections were monitored as the geometry changed, in order to identify the evolution of the observed structures. The data for an excess energy of 10 eV are compared to theory, and significant differences are found. Further calculations are required to aid in interpretation of the full range of cross sections that have been measured.
机译:提出了氙的差分横截面,用于在双对称运动学条件下进行低能(e,2e)测量,对于高于电离阈值5至40 eV的入射能量。研究了从共面到垂直平面的一系列几何形状,其中出射电子具有相等的能量和角度。随着几何形状的变化,对横截面进行监测,以识别观察到的结构的演变。将10 eV的多余能量的数据与理论进行比较,发现存在显着差异。需要进一步的计算以帮助解释已测量的整个横截面。

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