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Exponential depletion of neutral dangling bonds density (D ~0) by rare-earth doping in amorphous Si films (Conference Paper)

机译:非晶硅薄膜中稀土掺杂导致中性悬空键密度(D〜0)的指数耗尽(会议论文)

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摘要

In this work we study the effect reduction in the density of dangling bond species D ~0 states in rare-earth (RE) doped a-Si films as a function concentration for different RE-specimens. The films a-Si _(1-x)RE _x, RE=Y ~3, Gd ~3, Er ~3, Lu ~3) were prepared by co-sputtering and investigated by electron spin resonance (ESR) and Raman scattering experiments. According to our data the RE-doping reduces the ESR signal intensity of the D ~0 states with an exponential dependence on the rare-concentration. Furthermore, the reduction produced by the magnetic rare-earths Gd ~3 and Er ~3 is remarkably greater than that caused by Y ~3 and Lu ~3, which led us to suggest an exchange-like coupling between the spin of the magnetic REs ~3 and the spin of silicon neutral dangling bonds.
机译:在这项工作中,我们研究了稀土(re)掺杂的a-Si薄膜中悬空键物种D〜0态密度的降低对不同RE样品的功能浓度的影响。通过共溅射制备a-Si _(1-x)RE _x,RE = Y〜3,Gd〜3,Er〜3,Lu〜3)并通过电子自旋共振(ESR)和拉曼散射研究实验。根据我们的数据,RE掺杂降低了D〜0状态的ESR信号强度,并与稀有浓度成指数关系。此外,磁性稀土元素Gd〜3和Er〜3产生的还原作用明显大于Y〜3和Lu〜3引起的还原作用,这使我们提出了磁性RE的自旋之间的交换型耦合。 〜3和硅中性悬挂键的自旋。

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