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A comparative study of the microstructures and optical properties of Cu- and Ag-doped ZnO thin films

机译:铜和银掺杂ZnO薄膜的微观结构和光学性质的比较研究

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摘要

Cu- and Ag-doped ZnO films were deposited by direct current co-reactive magnetron sputtering technique. The microstructure, the chemical states of the oxygen, zinc, copper and silver and the optical properties in doped ZnO films were investigated by X-ray diffraction spectroscopy (XRD), X-ray photoelectron spectroscopy (XPS) and UV-Visible spectroscopy. XRD analysis revealed that both of Cu- and Ag-doped ZnO films consist of single phase ZnO with zincite structure while the doping elements had an evident effect on the (0 0 2) preferential orientation. The XPS spectra showed that the chemical states of oxygen were different in Cu- and Ag-doped ZnO thin films, which may lead to the shift of the band gap as can be observed in the transmittance and absorption spectra. Meanwhile, the widths of band tails of ZnO films became larger after Cu and Ag doping.
机译:通过直流共反应磁控溅射技术沉积了铜和银掺杂的ZnO薄膜。用X射线衍射光谱(XRD),X射线光电子能谱(XPS)和紫外可见光谱研究了掺杂的ZnO薄膜的微观结构,氧,锌,铜和银的化学态以及光学性质。 XRD分析表明,Cu和Ag掺杂的ZnO薄膜均由具有锌酸盐结构的单相ZnO组成,而掺杂元素对(0 0 2)择优取向有明显影响。 XPS光谱表明,在Cu和Ag掺杂的ZnO薄膜中,氧的化学态不同,这可能导致带隙的移动,如在透射率和吸收谱中所观察到的。同时,Cu和Ag掺杂后,ZnO薄膜的带尾宽度变大。

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