Growth, XRD and dielectric properties of triglycine sulpho-phosphate (TGSP) crystals added with magnesium sulfate

摘要

Pure and magnesium sulfate-doped triglycine sulpho-phosphate (TGSP) single crystals were grown by solution method with the slow evaporation technique. Solubility of the samples in de-ionized water was found in various temperatures ranging from 30 to 60 degrees C. Single-crystal X-ray diffraction (XRD) studies on the grown crystals reveal the monoclinic crystal structure. Atomic absorption study (AAS) was carried out to confirm the presence of Mg2+ in the grown doped TGSP crystals. Dielectric constant and dielectric loss of undoped and magnesium sulfate-doped TGSP crystals were measured for various frequencies and temperatures. It is observed from the studies that solubility and dielectric properties like dielectric constant and dielectric loss increase when TGSP crystal is added with magnesium sulfate. Thermogravimetric and differential thermal analyses (TG/DTA) on the grown crystals have been carried out. The effect of impurity (magnesium sulfate) on structural, electrical and thermal properties of TGSP crystals has been investigated.