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首页> 外文期刊>Physica, B. Condensed Matter >Electric and dielectric properties of a SiO2-Na2O-Nb2O5 glass subject to a controlled heat-treatment process
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Electric and dielectric properties of a SiO2-Na2O-Nb2O5 glass subject to a controlled heat-treatment process

机译:经受受控热处理工艺的SiO2-Na2O-Nb2O5玻璃的电和介电性能

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Glass and glass ceramics with the molar composition 60SiO(2)(_)30Na(2)O-10Nb(2)O(5) (mol%) were prepared by the melt-quenching method. Sodium niobate (NaNbO3) crystallites were precipitated on the surface of the glass through a controlled heat-treatment (HT) process. The NaNbO3 crystallites, detected by X-ray diffraction (XRD) in the 750 and 800 degrees C HT sample, have scientific and technological interest due to their electrical and dielectrical properties and potential applications in microwave, pyroelectric and piezoelectric devices. Scanning electron microscopy (SEM), XRD, DC and AC conductivity and dielectric relaxation measurements were the techniques used to study these glass and glass ceramic materials. The dielectric properties of the glass ceramics have a strong dependence on the HT temperature. The number of particles, precipitated in the surface of the glass-ceramic samples, increases from the 650 to the 750 degrees C samples and decreases in the 800 degrees C sample. The size of the surface particles increases with the rise of the HT temperature. In the 750 and 800 degrees C samples it was observed the presence of NaNbO3 particles. The DC (sigma(DC)) and AC conductivity (sigma(AC)) behaviour depends mainly of the number of network modifier ions in the glass matrix. The dielectric results are in agreement with the electric equivalent circuit formed by a three R/C (resistance in parallel with a capacitor element) serial model (two related with the sample surfaces and one with the bulk material). The dielectric relaxation data were fitted with a complex nonlinear least squares algorithm (CNLLS), which reveals that a resistor (R), in parallel with a constant phase element (CPE, Z(CPE) = 1/[Q(0)(jw)(n)]), is a good equivalent circuit. (c) 2007 Elsevier B.V. All rights reserved.
机译:通过熔融淬火法制备摩尔组成为60SiO(2)(_)30Na(2)O-10Nb(2)O(5)(mol%)的玻璃和玻璃陶瓷。铌酸钠(NaNbO3)微晶通过控制热处理(HT)过程沉淀在玻璃表面上。通过X射线衍射(XRD)在750和800摄氏度的HT样品中检测到的NaNbO3晶体由于具有电和介电特性以及在微波,热电和压电设备中的潜在应用,因此具有科学和技术兴趣。扫描电子显微镜(SEM),XRD,DC和AC电导率以及介电弛豫测量是用于研究这些玻璃和玻璃陶瓷材料的技术。玻璃陶瓷的介电性能与HT温度密切相关。沉淀在玻璃陶瓷样品表面的颗粒数量从650℃增加到750℃,而在800℃样品中减少。表面颗粒的尺寸随着HT温度的升高而增加。在750和800摄氏度的样品中,观察到NaNbO3颗粒的存在。 DC(sigma(DC))和AC电导率(sigma(AC))行为主要取决于玻璃基质中网络改性剂离子的数量。介电结果与由三个R / C(与电容器元件并联的电阻)串联模型(两个与样品表面有关,一个与散装材料有关)形成的等效电路一致。介电弛豫数据拟合了复杂的非线性最小二乘算法(CNLLS),该算法揭示出电阻器(R)与恒定相位元素(CPE,Z(CPE)= 1 / [Q(0)(jw) )(n)]),是一个很好的等效电路。 (c)2007 Elsevier B.V.保留所有权利。

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