Local structure around sn in CeCoIn5-xSnx

摘要

The local structure around Sri dopants in CeCoIn5-xSnx has been probed by extended X-ray absorption fine structure (EXAFS) technique. Our fit results for both x = 0.12 and x = 0.18 clearly indicate the dopant Sri atoms predominantly occupying the planar In(1) site. These results are consistent with the quasi-two-dimensional electronic properties of CeCoIn5 and will be discussed in relation to the observed bulk properties. (c) 2005 Elsevier B.V. All rights reserved.