A fast and accurate gamma correction based on Fourier spectrum analysis for digital fringe projection profilometry

摘要

In digital fringe projection profilometry, the gamma effect of the used electronic devices seriously affects the accuracy of three-dimensional (3D) topography measurements. Previous gamma correction methods do not take full advantage of the Fourier spectrum of the captured spatial-carrier phase-shifting fringe patterns. Hence, dozens of phase-shifting fringe patterns are required to carry out gamma pre-calibration. In this paper, a fast and accurate gamma correction technique based on a Fourier spectrum analysis is proposed. Only two spatial-carrier fringe patterns with different pre-encoded gamma values are needed and the number of fringe patterns required for gamma pre-calibration is significantly reduced without loss of accuracy. The proposed method is validated by experiments.