Multiple electrical breakdowns and electrical annealing using high current approximating breakdown current of silver nanowire network

摘要

The failure of a silver nanowire (AgNW) random network due to high electric current density is described. The AgNW network breaks down as result of electromigration and Joule heating at junctions, which leads to destroyed interconnections between AgNWs. The AgNW network is not completely destroyed after breakdown, but instead is able to undergo multiple breakdowns after being cooled down, with increased resistance and reduced breakdown current density. The breakdown current density of AgNW network is J(max) = 25 A cm(-2) for a network with R-s similar to 40 Omega sq(-1), outperforming a CuNW network. An effective electrical annealing method is demonstrated to decrease network resistance by 18% by periodically applying high current that is slightly lower than breakdown current with a period of 1 min for a few cycles.