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A metal-semiconductor-metal detector based on ZnO nanowires grown on a graphene layer

机译:基于生长在石墨烯层上的ZnO纳米线的金属-半导体-金属探测器

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摘要

High quality ZnO nanowires (NWs) were grown on a graphene layer by a hydrothermal method. The ZnO NWs revealed higher uniform surface morphology and better structural properties than ZnO NWs grown on SiO_2/Si substrate. A low dark current metal-semiconductor-metal photodetector based on ZnO NWs with Au Schottky contact has also been fabricated. The photodetector displays a low dark current of 1.53 nA at 1 V bias and a large UV-to-visible rejection ratio (up to four orders), which are significantly improved compared to conventional ZnO NW photodetectors. The improvement in UV detection performance is attributed to the existence of a surface plasmon at the interface of the ZnO and the graphene.
机译:通过水热法在石墨烯层上生长高质量的ZnO纳米线(NWs)。 ZnO NWs比在SiO_2 / Si衬底上生长的ZnO NWs具有更高的均匀表面形态和更好的结构性能。还制造了基于具有Au Schottky接触的ZnO NW的低暗电流金属-半导体-金属光电探测器。该光电探测器在1 V偏压下显示1.53 nA的低暗电流,并具有较大的UV-可见光抑制比(最高4个数量级),与常规ZnO NW光电探测器相比,显着改善。 UV检测性能的提高归因于在ZnO和石墨烯的界面处存在表面等离子体激元。

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