Sub-500 nm hard x ray focusing by compound long kinoform lenses

摘要

The focusing performance of polymethyl methacrylate compound long kinoform lenses with 70 mu m aperture and 19.5 mm focal length was characterized with 8 keV x rays using the knife-edge scan method at the 4W1A transmission x-ray microscope beamline of Beijing Synchrotron Radiation Facility. The experiment result shows a best FWHM focus size of 440 nm with 31% diffraction efficiency. (C) 2015 Optical Society of America