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Effect of incident angle and polarization on electrically-tunable defect mode in anisotropic photonic crystals

机译:入射角和偏振对各向异性光子晶体电可调缺陷模式的影响

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In this study, the effects of incident angle and state of wave polarization on electrically-tunable defect mode in a one-dimensional photonic crystal (1DPC) structure with an anisotropic defect layer is theoretically investigated. A 4 x 4 transfer matrix method is employed to calculate the transmittance spectrum of the structure with biased defect layer at different incident angles for TE and TM polarizations. The results indicate that at both polarizations, the peak wavelength of the defect mode shifts toward blue as the angle of incidence increases. Also, blue and red shifts can be observed in the defect mode for positive and negative biases, respectively. In addition, the defect mode compresses at TE (TM) polarization at negative (positive) biases and broadens for positive (negative) biases. A tunability defect mode may have potential application in the design of controllable optical filters in all optoelectronic devices. (c) 2016 Optical Society of America
机译:在这项研究中,理论上研究了具有各向异性缺陷层的一维光子晶体(1DPC)结构中入射角和波偏振状态对电可调缺陷模式的影响。对于TE和TM偏振,采用4×4转移矩阵方法计算了在不同入射角下具有缺陷层的结构的透射光谱。结果表明,在两种偏振下,缺陷模式的峰值波长都随着入射角的增加而向着蓝色偏移。同样,在缺陷模式下,对于正偏压和负偏压,可以分别观察到蓝移和红移。另外,缺陷模式在负(正)偏压下以TE(TM)极化压缩,并扩展为正(负)偏压。可调性缺陷模式可能在所有光电设备中可控光学滤波器的设计中具有潜在的应用。 (c)2016年美国眼镜学会

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