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Photothermal self-phase-modulation technique for absorption measurements on high-reflective coatings

机译:光热自相位调制技术用于高反射涂层上的吸收率测量

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We propose and demonstrate a new measurement technique for the optical absorption of high-reflection coatings. Our technique is based on photothermal self-phase modulation and exploits the deformation of cavity Airy peaks that occurs due to coating absorption of intracavity light. The mirror whose coating is under investigation needs to be the input mirror of a high-finesse cavity. Our example measurements were performed on a high-reflection SiO_(2)-Ta_(2)O_(5) coating in a three-mirror ring-cavity setup at a wavelength of 1064 nm. The optical absorption of the coating was determined to be alpha velence (23.9 +- 2.0) (centre dot) 10~(-6) per coating. Our result is in excellent agreement with an independently performed laser calorimetry measurement that gave a value of alpha velence (24.4 +- 3.2) (centre dot) 10~(-6) per coating. Since the self-phase modulation in our coating-absorption measurement affects mainly the propagation through the cavity input mirror, our measurement result is practically uninfluenced by the optical absorption of the other cavity mirrors.
机译:我们提出并演示了一种用于高反射涂层的光吸收的新测量技术。我们的技术基于光热自相位调制,并利用由于腔内光的涂层吸收而发生的腔艾里峰变形。涂层正在研究中的镜子必须是高级腔的输入镜子。我们的示例测量是在三反射环腔设置中的高反射率SiO_(2)-Ta_(2)O_(5)涂层上进行的,波长为1064 nm。涂层的光吸收被确定为每个涂层的αvelence(23.9±2.0)(中心点)10〜(-6)。我们的结果与独立执行的激光量热法测量值非常吻合,该测量值给出了每个涂层的Alvelence(24.4±-3.2)(中心点)10〜(-6)。由于我们的涂层吸收测量中的自相位调制主要影响通过腔体输入镜的传播,因此我们的测量结果实际上不受其他腔体镜的光吸收影响。

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