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High-precision measurement of a fiber connector end face by use of a Mirau interferometer

机译:使用Mirau干涉仪进行光纤连接器端面的高精度测量

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摘要

What we believe to be a new instrument for measuring the end-face geometrical parameters of fiber connectors is described. In this apparatus, a Mirau-type interferometric objective is employed to measure a small area of the connector end face and generate an interferogram corresponding to the surface profile. Various new technologies are used to ensure excellent performance and high measurement repeatability. A multipoint method is proposed to adjust the inclination of the physical contact sample stage. The physical contact angle of the sample stage is adjusted directly on the instrument by use of a special tool whose angle is calibrated with the reversal method. Measurement results of important parameters of the fiber connector end face are compared with those inspected by a commercial profiler or with a standard sample. Optical insertion losses of connectors inspected by the developed system are also evaluated.
机译:描述了我们认为是用于测量光纤连接器端面几何参数的新仪器。在该设备中,采用Mirau型干涉物镜来测量连接器端面的一小部分面积,并生成与表面轮廓相对应的干涉图。使用各种新技术来确保出色的性能和高测量重复性。提出了一种多点方法来调整物理接触样品台的倾斜度。样品台的物理接触角可通过使用特殊工具直接在仪器上进行调整,该工具的角度已通过反转方法进行了校准。将光纤连接器端面重要参数的测量结果与商用轮廓仪或标准样品检查的结果进行比较。还评估了由开发的系统检查的连接器的光插入损耗。

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