Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards (vol 407, pg 3211, 2015)

Senoner M.; Maassdorf A.; Rooch H.; Oesterle W.; Malcher M.; Schmidt M.; Kollmer F.; Paul D.; Hodoroaba V. -D.; Rades S.; Unger W. E. S.

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Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards (vol 407, pg 3211, 2015)

机译：表面分析仪器提供的纳米级图像的横向分辨率：BAM-L200认证参考材料和相关ISO标准的应用（第407卷，第3211页，2015年）

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《Analytical and bioanalytical chemistry》 |2015年第11期|共2页
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Senoner M.; Maassdorf A.; Rooch H.; Oesterle W.; Malcher M.; Schmidt M.; Kollmer F.; Paul D.; Hodoroaba V. -D.; Rades S.; Unger W. E. S.;
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1. Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards (vol 407, pg 3211, 2015) [J] . Senoner M., Maassdorf A., Rooch H., Analytical and bioanalytical chemistry . 2015,第11期

机译：表面分析仪器提供的纳米级图像的横向分辨率：BAM-L200认证参考材料和相关ISO标准的应用（第407卷，第3211页，2015年）
2. Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards (vol 407, pg 3211, 2015) [J] . Senoner M., Maassdorf A., Rooch H., Analytical and bioanalytical chemistry . 2015,第11期

机译：表面分析仪器提供的纳米级图像的横向分辨率：BAM-L200认证参考材料和相关ISO标准的应用（第407卷，第3211页，2015年）
3. Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards [J] . Senoner M., Maassdorf A., Rooch H., Analytical and bioanalytical chemistry . 2015,第11期

机译：表面分析仪器提供的纳米级图像的横向分辨率：BAM-L200认证参考材料和相关ISO标准的应用
4. Standard Reference Materials for the Measurement of Instrument Resolution Functions: Effect of Transparency [C] . European powder diffraction conference . 1998

机译：用于测量仪表分辨率的标准参考材料功能：透明度的影响
5. Erratum to: Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards [O] . M. Senoner, A. Maaßdorf, H. Rooch, 2015

机译：错误：通过表面分析仪器提供的纳米级图像的横向分辨率：Application的BAM-L200认证的参考资料及相关ISO标准
6. Comparison of Methods for Calculation of Recommended Elemental Concentrations for Canadian Certified Reference Materials Project Rock Standards SY-2, SY-3, and MRG-1 [R] . Gladney, E. S. 1981

机译：加拿大认证标准物质项目岩石标准sY-2，sY-3和mRG-1计算推荐元素浓度的方法比较

Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards (vol 407, pg 3211, 2015)

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