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Reduction of the SIMS Matrix Effect Using the Storing Matter Technique: A Case Study on Ti in Different Matrices

机译:利用存储技术降低SIMS基质效应:不同基质中Ti的实例研究

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摘要

Matrix effects in secondary ion mass spectrometry render quantitative analysis difficult. In this paper, we report on the quantitative potential of the so-called storing matter technique. On the basis of a case study focusing on Ti sputtered from five different chemical environments (Ti, TiB_2,TiC, TiN and TiO_2), we demonstrate for the first time that the SIMS matrix effect can be avoided in a multitude of matrices by this novel approach. The effect of the collector material (Au, Ag, Cu, and Ta) on the overall efficiency of the storing matter process is investigated. In addition, the influence of oxygen on the obtained useful yields is exposed. Finally, the performance of the storing matter technique is compared to standard SIMS analysis.
机译:二次离子质谱法中的基质效应使定量分析变得困难。在本文中,我们报告了所谓存储物质技术的定量潜力。在针对从五个不同化学环境(Ti,TiB_2,TiC,TiN和TiO_2)溅射的Ti进行的案例研究的基础上,我们首次证明了通过这种新颖方法可以避免在多种基质中使用SIMS基质效应方法。研究了集电器材料(Au,Ag,Cu和Ta)对存储过程总效率的影响。另外,暴露了氧气对获得的有用产率的影响。最后,将存储物质技术的性能与标准SIMS分析进行比较。

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