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Quantitative Correlations between the Normal Incidence Differential Reflectance and the Coverage of Adsorbed Bromide on a Polycrystalline Platinum Rotating Disk Electrode

机译:垂直入射微分反射率与多晶铂旋转盘电极上吸附的溴化物覆盖率之间的定量相关性

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摘要

Normal incidence reflectance spectra (λ = 635 nm) data were acquired from a Pt disk of a rotating PtlPt ring-disk electrode in 0.1 M HClO_4 solutions containing bromide in the μM range, while scanning the disk potential linearly and measuring the diffusion limited bromide oxidation current at the ring. Analysis of the results obtained made it possible to correlate quantitatively the relative intensity of the reflected light, R, with the bromide coverage, i.e. the fraction of the surface covered by bromide, assuming the remaining areas of the Pt disk are covered by adsorbed hydrogen, using empirical functions to account for the potential dependence of the optical signals for each of the two surface regions. This technique opens new prospects for monitoring in real time the coverage of bromide and perhaps other adsorbed species during the course of a faradaic process under well-defined conditions of mass transport control.
机译:从旋转的PtlPt环形圆盘电极的Pt圆盘在0.1M含μM范围内的溴化物的HClO_4溶液中获取法向入射反射光谱(λ= 635 nm)数据,同时线性扫描圆盘电位并测量扩散限制的溴化物氧化当前在环。对获得的结果进行分析,就可以使反射光的相对强度R与溴化物覆盖率(即被溴化物覆盖的表面的比例)定量相关,假设Pt盘的其余区域被吸附的氢覆盖,使用经验函数来说明两个表面区域中每一个的光信号的电势依赖性。该技术为在明确定义的大规模运输控制条件下的法拉第过程中实时监测溴化物和其他吸附物质的覆盖范围开辟了新的前景。

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