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Cubic phase content and structure of BN films from an X-ray absorption study

机译:X射线吸收研究的BN薄膜的立方相含量和结构

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摘要

X-ray absorption near-edge structure (XANES) was used to study the cubic boron nitride (c-BN) content in the BN films deposited on various substrates by different physical vapor deposition or plasma-enhanced chemical vapor deposition methods. By fitting the XANES curves of thin-film samples using standard spectra of pure c-BN and sp(2)-bonded BN in the films with suitable weight factors, the c-BN contents at the film's surface region and across the film's thickness have been determined quantitatively. The results agree well with the previous transmission electron microscopic observations. The method is proved to be independent of the optical properties of thin film and provides a possibility to evaluate the cubic content of BN films accurately.
机译:利用X射线吸收近边缘结构(XANES)研究了通过不同的物理气相沉积或等离子体增强化学气相沉积方法沉积在各种基板上的BN膜中的立方氮化硼(c-BN)含量。通过使用具有适当权重因子的纯c-BN和sp(2)键合的BN的标准光谱拟合薄膜样品的XANES曲线,在膜的表面区域和整个膜的厚度中的c-BN含量达到被定量确定。结果与先前的透射电子显微镜观察结果非常吻合。实践证明,该方法与薄膜的光学特性无关,为准确评估BN薄膜的立方含量提供了可能。

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