A study on system characterization of an optical E-field probe

摘要

The E-field strength is an important quantity in electromagnetic compatibility measurements and several types of the field probe are currently in the market. An optical field probe consists of dielectric materials and minimum metallic parts not to perturb the original field distribution. In addition, characteristics required for the field probe are the system stability and sensitivity. Since the signal to noise ratio considerably affects the probe readout especially at a low field level, several configurations of instruments are investigated in the present paper.