Layer-by-layer analysis of three-dimensional component distributions in rapidly solidified low alloyed aluminum alloys

摘要

By means of Rutherford backscattering spectroscopy technique a detailed component depth distributions in rapidly solidified foils of Al-Me (Me--Fe, Cu, Sb) and Al-Ge alloys have been investigated. It was found tliat on the foil surface (0.04-0.06 mm depth) ffie component concentrations exceed the experimental measured values. Me concentration oscillates through the thickness of the layers investigated, while in the rapidly solidified Al-Ge alloy no component oscillation was detected.