Studies on methodology for developing accelerated testing by precise analysis of failures utilizing FTA and it's application to semiconductor sensors

摘要

Along with the evolution of electronics, sensors are widely used in vessels and vehicles making operations safe and comfortable. Different from other electronic components, sensors are, however, used in harsh environments and sometimes conventional testing is not sufficient enough to evaluate their reliability. This report presents a study where WA and existing information from design, production and fields are effectively used to find factors affecting the failure quickly, effectively and accurately without redundant experiments and analysis. In addition, newly developed FMFC, and comprehensive recurrence experiment methods are proposed to find correct failure mechanism. Through these processes, we expect to develop accelerated testing with smaller yet accurate experiments. Finally, we verified the effects of the aforementioned method by successfully applying it to the thermistor temperature sensors.