ANALYSIS OF MODULATED OPTICAL REFLECTANCE APPLIED TO MAGNETOELECTRIC NANOMATERIALS

摘要

Structural and defectoscopic photothermal analysis of high spatial resolu-tion is performed to sample ferromagnetic LSMO films. The modulated optical reflectance of the surface of the film in the laser focus is indicative of its magne-toelectric properties and is found to be proportional to the thermal variations of free carrier density.