In order to prevent operation problems in plants, it is important to predict degradation of printed circuit boards used in electric components. Toshiba has been progressively developing various life assessment methods for printed circuit boards and electronic devices that can meet the needs of users. In addition to precision methods based on tests of samples we have developed a new life assessment method based on environmental information. The method takes account of the interactive effect on degradation of multiple atmospheric factors. This new method is useful for maintenance and management.
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