Analysis of high-purity fullerites using an MI-1201 mass spectrometer

摘要

The results of measurements of the C_(70) content of a C_(60) single crystal on a standard MI-1201 mass spectrometer with an improved ion source employing electron-impact ionization are presented. The method is suitable for the mass-spectrometric analysis of other solid substances with vapor pressures no lower than 1 x 10~(-3) Pa at the temperatures up to 800 deg C.