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Experimental branching fractions, transition probabilities, and oscillator strengths in Sn i

机译:Sn i中的实验分支分数,跃迁几率和振荡器强度

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摘要

Branching fractions of Sn I for 66 spectral lines from the even-parity 5pnp (n = 7, 8, 11-13, 17-19, 27, 32) and 5pnf (n = 4-7, 9, 11, 13, 16, 18) levels and the odd-parity 5p6s level have been experimentally determined based on the emission spectrum of a hollow cathode lamp. In addition, transition probabilities and oscillator strengths for 59 lines among the above ones have been derived from a combination of the radiative lifetimes reported in the literature and the branching fractions obtained in the present paper.
机译:Sn I对于66个光谱线的分支分数来自偶数奇偶校验5pnp(n = 7、8、11-13、17-19、27、32)和5pnf(n = 4-7、9、11、13、16 ,18)的水平和奇数奇偶校验5p6s水平已经根据空心阴极灯的发射光谱通过实验确定。另外,上述文献中59条谱线的跃迁概率和振子强度是结合文献报道的辐射寿命和本文所获得的支化分数得出的。

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