In-depth resolution from multifrequency Born fields scattered by a dielectric strip in the Fresnel zone

摘要

The achievable depth resolution in reconstructing the permittivity profile of a dielectric strip under the Born approximation when data are collected in the Fresnel zone is studied. We consider a rectilinear measurement aperture and an orthogonal and centered rectilinear investigation domain. The roles of the aperture extent and frequency diversity are highlighted.