Differential reflection phase shift under conditions of attenuated internal reflection

摘要

The angle-of-incidence dependence of the differential reflection phase shift h between p and s polarizations is considered a function of the real and imaginary parts of the relative complex dielectric function e of an interface in the domain of fractional optical constants, i.e., under conditions of internal reflection. The constraint on complex e such that oscillatory and monotonic angular responses are obtained is determined. A sensitive and stable technique, which is based on attenuated internal reflection ellipsometry between the Brewster angle and the critical angle, is proposed for measuring small induced absorption (ε_(i)～10~(-5) in the medium of refraction.