Development of diamond-based X-ray detection for high-flux beamline diagnostics

摘要

High-quality single-crystal and polycrystalline chemical-vapor-deposition diamond detectors with platinum contacts have been tested at the white-beam X28C beamline at the National Synchrotron Light Source under high-flux conditions. The voltage dependence of these devices has been measured under both DC and pulsed-bias conditions, establishing the presence or absence of photoconductive gain in each device. Linear response consistent with the theoretically determined ionization energy has been achieved over eleven orders of magnitude when combined with previous low-flux studies. Temporal measurements with single-crystal diamond detectors have resolved the nanosecond-scale pulse structures of both the NSLS and the APS. Prototype single-crystal quadrant detectors have provided the ability to simultaneously resolve the X-ray beam position and obtain a quantitative measurement of the flux.