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首页> 外文期刊>Journal of synchrotron radiation >Performance of a cryogenic silicon monochromator under extreme heat load
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Performance of a cryogenic silicon monochromator under extreme heat load

机译:极低热负荷下低温硅单色仪的性能

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The performance of an indirectly cooled cryogenic silicon monochromator under heat loads up to 870 W has been studied. The investigation was performed over numerous parameters and included measurements of total flux, spectral density, rocking curves, angular beam profiles and crystal slope errors. An almost ideal monochromator performance was observed in the 270 - 570 W range of the heating power. At a heat load of similar to 400 W and under standard operation conditions, the crystal distortions did not exceed 1 murad. At the highest available heat load of 870 W, the crystal distortions were about 7 murad. [References: 23]
机译:研究了间接冷却的低温硅单色仪在高达870 W的热负荷下的性能。这项研究是针对众多参数进行的,包括总通量,光谱密度,摇摆曲线,角光束轮廓和晶体斜率误差的测量。在270-570 W的加热功率范围内观察到了几乎理想的单色仪性能。在类似于400 W的热负荷下,在标准操作条件下,晶体畸变不超过1 murad。在870 W的最高可用热负荷下,晶体畸变约为7 murad。 [参考:23]

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