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首页> 外文期刊>Journal of the European Ceramic Society >Simultaneous WDXS and EBSD investigations of dense PLZT ceramics
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Simultaneous WDXS and EBSD investigations of dense PLZT ceramics

机译:WDXS和EBSD同时研究致密PLZT陶瓷

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摘要

Electron probe microanalysis (EPMA) with appropriate standards and precisely adjusted experimental conditions has been successfully applied to an accurate quantitative elemental analysis of the lead-lanfhanum-zirconium-titanate (PLZT) ceramics with composition Pb_(1-3x/2)La_xZr-(0.65)Ti_(0.35)O_3, where x - 0.08. Heterogeneity tests for Pb, La, Ti and Zr performed on highly dense polycrystalline PLZT ceramics showed relatively large scatter in some data, especially for Ti. To check whether the crystallographic orientations or misorientations of PLZT grains have any potential influence on the chemical composition determined by the wavelength-dispersive X-ray spectroscopy (WDXS), orientation maps have been measured, for exactly same areas as in the WDXS measurements. The measurements of single orientations in the PLZT grains were performed with the use of an electron backscatter diffraction (EBSD) facility attached to a low-vacuum scanning electron microscope (LV-SEM). The single orientation maps of the PLZT samples and corresponding WDXS semi-quantitative results for cations concentration distribution are presented and discussed.
机译:具有适当标准和精确调整的实验条件的电子探针微分析(EPMA)已成功地应用于组成成分为Pb_(1-3x / 2)La_xZr-( 0.65)Ti_(0.35)O_3,其中x-0.08。在高密度多晶PLZT陶瓷上进行的Pb,La,Ti和Zr的异质性测试在某些数据中显示出较大的散射,特别是对于Ti。为了检查PLZT晶粒的晶体取向或取向错误是否对由波长色散X射线光谱法(WDXS)确定的化学成分有任何潜在影响,已针对与WDXS测量相同的区域测量了取向图。使用连接到低真空扫描电子显微镜(LV-SEM)的电子背散射衍射(EBSD)设备进行PLZT晶粒中单个方向的测量。介绍并讨论了PLZT样品的单向图和相应的WDXS阳离子浓度分布的半定量结果。

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