APPLICATION OF X-RAY DIFFRACTION METHODS FOR THE ASSESSMENT OF MACHINED SURFACE QUALITY OF PARATELLURITE MONOCRYSTALS

摘要

The use of X-ray diffraction scanning (with 9/20) and swinging (with the 20 angle being constant) methods has enabled the authors to find the dependence of the width of reflections of two orders on the K{sub}β-radiation from different crystallographic planes of paratellurite monocrystals. The swinging method has been found to be more sensitive to the general state of the TeO{sub}2 monocrystal surface upon any machining operation (cleavage, cutting, grinding, and polishing). The authors have observed a tendency for the width of peaks of reflections of various orders to coincide, thus pointing to a high-quality machined surface with the lowest surface roughness.