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Assessment of a Binary Measurement System in Current Use

机译:评估当前使用的二进制测量系统

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摘要

Binary measurement systems that classify parts as pass or fail are widely used in industry, especially for systematic inspection in high-volume processes. In this context, we are likely to have available a large number of previously measured passed and failed parts. To support production and quality improvement, it is important to assess the misclassification rates, e.g., the probability of failing a conforming part or passing a nonconforming part. We may also want to estimate the unknown conforming rate. Here we focus on the assessment of a binary measurement system when no gold-standard measurement system is available. The standard assessment plan is to repeatedly measure a sample of parts and use a latent class model. We demonstrate the substantial benefit of supplementing the standard plan with the available data from the previously measured parts. We propose new sampling plans and compare them with the standard plan with respect to the precision of the estimators of the misclassification rates. We also give recommendations for planning an assessment study when we can sample from a population of previously measured parts.
机译:将零件分类为合格或不合格的二进制测量系统已广泛用于工业中,尤其是用于大批量过程中的系统检查。在这种情况下,我们很可能拥有大量先前测量的合格和不合格零件。为了支持生产和质量改进,重要的是评估误分类率,例如,合格品不合格或不合格品通过的概率。我们可能还想估计未知的合格率。在这里,当没有黄金标准的测量系统可用时,我们将重点放在对二进制测量系统的评估上。标准评估计划是重复测量零件样本并使用潜在类别模型。我们展示了用先前测量的零件中的可用数据补充标准计划的巨大好处。我们提出了新的抽样方案,并将它们与标准方案进行比较,以评估误分类率的准确性。当我们可以从大量先前测量的零件中取样时,我们也为规划评估研究提供了建议。

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