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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >DETERMINING THE RELATIVE PERMITTIVITY AND THICKNESS OF A LOSSLESS DIELECTRIC OVERLAYER ON A METAL FILM USING OPTICALLY EXCITED SURFACE PLASMON POLARITONS
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DETERMINING THE RELATIVE PERMITTIVITY AND THICKNESS OF A LOSSLESS DIELECTRIC OVERLAYER ON A METAL FILM USING OPTICALLY EXCITED SURFACE PLASMON POLARITONS

机译:用光学激发表面等离激元法测定金属膜上无损耗介电层的相对介电常数和厚度

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摘要

Numerical simulations based on the exact Fresnel equations are used to show that it is possible to determine uniquely the relative permittivity and thickness of a thin lossless dielectric film adsorbed on a gold or silver layer. The calculations, which include the effects of up to 1% random noise on the experimental data, show clearly that there is no degeneracy in the solutions of the Fresnel equations even for films as thin as 2 nm. It is shown that gold is preferable to silver as a substrate when the overlayer properties need to be determined accurately. It is further shown that, if the overlayer is bounded by water rather than air,then the experimental constraints would preclude the use of silver as a substrate but measurements would still be possible with gold. [References: 33]
机译:基于精确的菲涅耳方程的数值模拟表明,可以唯一确定吸附在金或银层上的无损电介质薄膜的相对介电常数和厚度。计算包括高达1%的随机噪声对实验数据的影响,清楚地表明,即使对于2 nm的薄膜,菲涅耳方程组的解也没有退化。结果表明,当需要精确确定覆盖层性能时,金比银作为基材更好。进一步表明,如果覆盖层是由水而不是空气限制的,那么实验上的限制将排除使用银作为衬底,但是使用金仍然可以进行测量。 [参考:33]

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