Soft x-ray photoionization and fragmentation of SO_2 studied by threshold photoelectron-photoion-photoion coincidence (TPEPIPICO) spectroscopy

摘要

The photoionization of SO_2 has been studied in the photon energy range 160-560 eV using the SRS at Daresbury Laboratory, UK. Threshold photoelectron and total ion-yield spectra are presented in the region of the S 2p and O 1s edges. Ion branching ratios are obtained from threshold photoelectron-photoion coincidence (TPEPICO) data and the detailed dynamics of the fragmentation process determined using the threshold photoelectron-photoion-photoion coincidence (TPEPIPICO) technique. The data are compared with other results at the S 2p edges, and with previous studies of SO_2 in the vacuum ultraviolet spectral region.