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LED-based digital holographic microscopy with slightly off-axis interferometry

机译:基于LED的数字全息显微镜,具有轻微的偏轴干涉法

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摘要

An LED illuminated Linnik-type digital holographic microscope (DHM) for high-quality phase imaging is presented by the adoption of slightly off-axis two-step blind-phase-shifting interferometry (TB-PSI). Slightly off-axis interferometry lowers the requirement on the angle between the object and the reference waves as well as the requirement on the resolving power of the charge-coupled device (CCD) camera. In addition, the apparatus is cost-effective and offers ease of alignment. The phase-shifting DHM is simply implemented by mechanically moving the reference mirror while disposing of a precise phase modulator such as a piezoelectric transducer (PZT). The phase shift between the two interferograms is extracted by Fourier transformation analysis, and then the phase image is reconstructed. The performance of the TB-PSI used in the scheme is analyzed. The phase imaging for nanostructured specimens is conducted, and the results demonstrate the feasibility of the scheme. The phase noise is reduced by 73% when compared to the result obtained with coherent illumination.
机译:通过采用稍微偏轴的两步盲相移相干涉法(TB-PSI),提出了用于高质量相位成像的LED照明的Linnik型数字全息显微镜(DHM)。轻微的离轴干涉测量降低了对物体与参考波之间的角度的要求以及对电荷耦合器件(CCD)摄像机的分辨能力的要求。另外,该设备具有成本效益并且易于对准。移相DHM可以简单地通过机械地移动参考镜,同时配置诸如压电换能器(PZT)之类的精确相位调制器来实现。通过傅立叶变换分析提取两个干涉图之间的相移,然后重建相位图像。分析了该方案中使用的TB-PSI的性能。进行了纳米结构标本的相成像,结果证明了该方案的可行性。与相干照明相比,相位噪声降低了73%。

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