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首页> 外文期刊>Journal of Mycology and Plant Pathology >Phenotyping of Indian and exotic wheat germplasm against spot blotch (Bipolaris sorokiniana).
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Phenotyping of Indian and exotic wheat germplasm against spot blotch (Bipolaris sorokiniana).

机译:印度和外来小麦种质的表型抗斑点斑点(Bipolaris sorokiniana)。

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Twenty wheat genotypes, obtained from the Directorate of Wheat Research, Karnal (Haryana, India), Division of Genetics and Division of Plant Pathology, Indian Agricultural Research Institute (New Delhi, India), were screened for spot blotch resistance against 3 isolates (BS-25, BS-34 and BS-75) of Bipolaris sorokiniana [Cochliobolus sativus] in a glasshouse. BS-75 showed the maximum virulence with mean percentage disease index (PDI) of 37.1, followed by BS-34 (36.1) and BS 25 (35.1). Among the wheat genotypes, Lok Bharti was found highly susceptible to all 3 isolates, with average PDI of 60.0, which was higher than that of control Agra Local (56.7). Synthetic-23 showed moderately resistance reaction with PDI 0f 15.71 to all tested isolates.
机译:筛选了从印度农业研究所(印度新德里)遗传学部和植物病理学部(印度,印度哈里亚纳邦)小麦研究总局获得的二十种小麦基因型,以检测其对三种分离株(BS)的斑点斑点抗性温室中的B.O.B.-25,BS-34和BS-75)。 BS-75表现出最大毒力,平均疾病指数(PDI)为37.1,其次是BS-34(36.1)和BS 25(35.1)。在小麦基因型中,Lok Bharti被发现对所有三个分离株高度敏感,平均PDI为60.0,高于对照Agra Local(56.7)。 Synthetic-23对所有测试的分离物均显示与PDI 0f 15.71的中等抗性反应。

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