首页> 外文期刊>Journal of Materials Chemistry, C. materials for optical and electronic devices >Effect of Nb and Ta substitution on donor electron transport and ultrafast carrier dynamics in anatase TiO2 thin films
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Effect of Nb and Ta substitution on donor electron transport and ultrafast carrier dynamics in anatase TiO2 thin films

机译:Nb和Ta替代对锐钛矿型TiO2薄膜中给体电子传输和超快载流子动力学的影响

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摘要

Ta and Nb substituted TiO2 are important transparent conducting oxides that have potential for applications in photovoltaics, photocatalysis, and water splitting/CO2 sequestration. In addition to donating electrons, what are the effects of Nb and Ta substitution? Here we observe strong experimental evidence that Ta and Nb substitution induces large and small polarons in anatase TiO2 epitaxial thin films. The degenerate donor electrons (from both Nb and Ta) show a high temperature T-3 dependence on electrical resistivity, which confirms the presence of large polarons, along with room temperature metallic transport. This is further confirmed by the enhancement in the electron effective mass, which was estimated from thermopower measurements. Femtosecond transient absorption (fs-TA) reveals the life time of the Ti-t(2g) and e(g) levels and the separation of these levels are consistent with the X-ray absorption spectroscopy (XAS) measurement. In addition, fs-TA reveals the presence of small polarons with a life time substantially 41 ns, which arises from defect levels and is a consequence of Ta and Nb substitution. X-ray photoelectron spectroscopy (XPS) provides evidence of Ti3+, which may be identified as the defects responsible for the small polarons. These long-lived small polarons may provide a way to minimize recombination dynamics in TiO2-based electrodes for photo-excited devices.
机译:Ta和Nb取代的TiO2是重要的透明导电氧化物,具有在光伏,光催化和水分解/ CO2隔离中应用的潜力。除了提供电子外,Nb和Ta替代还会产生什么影响?在这里,我们观察到强有力的实验证据,表明Ta和Nb取代会在锐钛矿型TiO2外延薄膜中诱导出大和小的极化子。退化的供体电子(来自Nb和Ta)显示出高温T-3对电阻率的依赖性,这证实了存在大极化子以及室温金属传输。电子有效质量的提高进一步证实了这一点,这是根据热功率测量结果估算得出的。飞秒瞬态吸收(fs-TA)揭示了Ti-t(2g)和e(g)含量的寿命,这些含量的分离与X射线吸收光谱(XAS)测量一致。此外,fs-TA揭示了寿命为41 ns的小极化子的存在,这是由缺陷水平引起的,并且是Ta和Nb替代的结果。 X射线光电子能谱(XPS)提供了Ti3 +的证据,Ti3 +可能被认为是造成小极化子的缺陷。这些长寿命的小极化子可以提供一种使光激发器件的TiO2基电极中的复合动力学最小化的方法。

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