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Detection of nanoparticles using optical gradient forces

机译:使用光学梯度力检测纳米颗粒

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摘要

We present a detection scheme for nanoscale particles based on the gradient force and torque near a tightly focused laser beam. The focus affects the path of nanoparticles passing by and a quadrant detector records the particle trajectory. A feedback system continuously adjusts the laser power and thereby prevents the particles from being trapped. Particle size and shape can be assessed by evaluating the time-trace of the quadrant detector signal.
机译:我们提出了一种基于紧紧聚焦的激光束附近的梯度力和扭矩的纳米级粒子检测方案。焦点影响纳米粒子通过的路径,一个象限检测器记录粒子的轨迹。反馈系统不断调节激光功率,从而防止颗粒被捕获。可以通过评估象限检测器信号的时间轨迹来评估粒径和形状。

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