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Free-running single-photon detection based on a negative feedback InGaAs APD (Conference Paper)

机译:基于负反馈InGaAs APD的自由运行单光子检测(会议论文)

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摘要

InGaAs/InP-based semiconductor avalanche photodiodes are usually employed for single-photon counting at telecom wavelength. However they are affected by afterpulsing which limits the diode performance. Recently, Princeton Lightwave has commercialized a diode integrating monolithically a feedback resistor. This solution effectively quenches the avalanche and drastically reduces afterpulsing. Here, we report the development and characterization of a detector module based on this diode, implementing an active hold-off circuit which further reduces the afterpulsing and notably improves the detector performances. We demonstrate free-running operation with 600Hz dark count rate at 10% detection efficiency. We also improved the standard double-window technique for the afterpulsing characterization. Our algorithm implemented by a FPGA allows one to put the APD in a well-defined initial condition and to measure the impact of the higher order afterpulses.
机译:基于InGaAs / InP的半导体雪崩光电二极管通常用于电信波长下的单光子计数。但是,它们会受到后脉冲的影响,从而限制了二极管的性能。近来,普林斯顿光波已经将集成了反馈电阻的二极管商业化。该解决方案有效地消除了雪崩并大大减少了后脉冲。在这里,我们报告了基于该二极管的检测器模块的开发和特性,实现了一种有源释抑电路,该电路进一步减少了后脉冲,并显着提高了检测器的性能。我们展示了以10Hz的检测效率在600Hz暗计数率下的自由运行。我们还改进了标准的双窗口技术,用于后脉冲表征。由FPGA实现的我们的算法允许人们将APD置于定义明确的初始状态,并测量高阶后脉冲的影响。

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