Spectral dependence of the complex refractive index of GeS_2 chaScogenide glass thin films

摘要

The excellent transmittance of chalcogenide glassy semiconductors [1], reaching up to the far-infrared spectra region, and the wide range of photo-induced effects that they exhibit [2], generally accompanied by significant changes in their optical constants, make it possible to use them as absorption filters and many other optical elements [3]. Knowledge of the optical properties of these amorphous materials is obviously necessary for exploiting their very inter-esting technological potential. This letter is con-cerned with the optical characterization of as-deposited GeS2 chalcogenide glass films, prepared by vacuum thermal evaporation, using a very accurate data-processing method proposed by Swa-nepoel [4], based only on their optical transmission spectra [5, 6].