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首页> 外文期刊>Journal of mass spectrometry: JMS >Development toward a double focusing isotopic separator for noble gas isotope enrichment
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Development toward a double focusing isotopic separator for noble gas isotope enrichment

机译:向稀有气体同位素富集的双聚焦同位素分离器的发展

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A double focusing sector field mass filter used in Nier-Johnson geometry has been built in order to perform Kr isotope enrichment for Kr-81 and Kr-85 isotopes. The principle consists in implanting Kr+ ions accelerated at 7keV in Al foils after separation using the magnetic sector. A specific ion source has been designed capable of generating high Kr+ ion beams (>0.5A) to transfer into the collecting Al foils in 3 to 5h significant fractions of large Kr samples (10(15) to 10(16) atoms) initially introduced in the instrument. Implanted Kr isotopes can be further selectively released from the Al foil by surface ablation using an infrared laser beam. Implantation yields and enrichment factors are measured using a conventional mass spectrometer. Copyright (c) 2016 John Wiley & Sons, Ltd.
机译:为了对Kr-81和Kr-85同位素进行Kr同位素富集,已经建立了用于Nier-Johnson几何的双聚焦扇形场质量过滤器。原理在于使用磁扇面进行分离后,将加速到7keV的Kr +离子注入到铝箔中。已经设计了一种特定的离子源,该离子源能够产生高Kr +离子束(> 0.5A),以便在最初引入的大Kr样品(10(15)至10(16)原子)的3至5小时内转移到收集的铝箔中。在仪器中。通过使用红外激光束进行表面烧蚀,可以进一步从铝箔中选择性地释放注入的Kr同位素。使用常规质谱仪测量植入的产量和富集因子。版权所有(c)2016 John Wiley&Sons,Ltd.

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