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Effects of ZnO Seed Layers Prepared with Various Precursor Concentrations on Structural and Defect Emission Properties of ZnO Nanorods Grown by Hydrothermal Method

机译:不同前体浓度制备的ZnO晶种层对水热法生长ZnO纳米棒结构和缺陷发射特性的影响

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摘要

ZnO nanorods were grown by a hydrothermal method on ZnO seed layers that had previously been prepared from solutions containing various precursor concentrations. The effects of the ZnO seed layers prepared with various precursor concentrations on the structural and defect emissions of the ZnO nanorods were investigated by scanning electron microscopy (SEM), X-ray diffraction (XRD), and photoluminescence (PL) spectroscopy. The surface morphology of the ZnO seed layers changed with an increasing precursor concentration, and the diameters and densities of the ZnO nanorods depended on the morphologies of the ZnO seed layers. The ZnO seed layers prepared with various precursor concentrations affected the residual stress in the nanorods grown on the seed layers, the intensity and full widths at half maximum of the 2-theta angle in the XRD spectra for the nanorods, and the intensity and position of the defect emission peak in deep-level emission (DLE) PL spectra for the ZnO nanorods.
机译:ZnO纳米棒通过水热法在ZnO种子层上生长,而ZnO种子层以前是从包含各种前体浓度的溶液中制备的。通过扫描电子显微镜(SEM),X射线衍射(XRD)和光致发光(PL)光谱研究了以各种前驱体浓度制备的ZnO晶种层对ZnO纳米棒的结构和缺陷发射的影响。 ZnO种子层的表面形态随前驱物浓度的增加而变化,ZnO纳米棒的直径和密度取决于ZnO种子层的形态。用各种前体浓度制备的ZnO种子层会影响在种子层上生长的纳米棒中的残余应力,纳米棒的XRD光谱中2-θ角的强度和最大半峰全宽以及纳米棒的强度和位置ZnO纳米棒的深层发射(DLE)PL光谱中的缺陷发射峰。

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