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首页> 外文期刊>Journal of Electronic Materials >Effect of Cooling Rate on Microstructural Homogeneity and Grain Size of n-Type Si-Ge Thermoelectric Alloy by Melt Spinning
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Effect of Cooling Rate on Microstructural Homogeneity and Grain Size of n-Type Si-Ge Thermoelectric Alloy by Melt Spinning

机译:冷却速率对熔体纺丝n型硅锗热电合金组织均匀性和晶粒尺寸的影响

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摘要

n-Type Si-Ge thermoelectric alloys were prepared using a melt spinning (MS) process, and then the microstructures of the samples were investigated. The alloys studied were ribbon shaped with a thickness of about 30 (mu)m. Scanning electron microscopy (SEM) along with energy-dispersive spectrometry (EDS) and x-ray diffraction (XRD) showed a predictable, homogeneous, fine-grained microstructure at the high cooling rate, different from those of samples created by slow solidification (SS).
机译:使用熔体纺丝(MS)工艺制备n型Si-Ge热电合金,然后研究样品的微观结构。研究的合金是带状的,厚度为约30μm。扫描电子显微镜(SEM)以及能量分散光谱(EDS)和X射线衍射(XRD)显示了在高冷却速率下可预测的,均匀的细晶粒组织,这与慢速凝固(SS)生成的样品不同)。

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