Estimation of the Concentration of Charge Carriers in a Conductive Layer between LaAlO_3 and SrTiO_3 Dielectrics

摘要

Using the capacitor model by Goetzberger, the concentration of charge carriers on the contact layer LAO/STO is evaluated. The obtained results are shown to be comparable with those obtained within the framework of “polar catastrophe” model. Some possible interpretations of charge carriers, concentration variations, depending on the thickness of deposited layers, are presented as well, both for the “pure” (LAO) and composite (LASTO) ones.