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Textured-Ba(Zr,Ti)O_3 piezoelectric ceramics fabricated by templated grain growth (TGG)

机译:模板化晶粒生长(TGG)制成的织构Ba(Zr,Ti)O_3压电陶瓷

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摘要

Ba(Zr_(0.085)Ti_(0.915))O_3 (BZT) ceramics were grain-oriented (textured) in the <001>-orientation using the Templated Grain Growth (TGG) process. The piezoelectric response of the textured samples was enhanced when poled and measured in the <001>-textured direction. The d_(33)-coefficients for samples measured with a low drive field (<5 kV/cm) displayed values as high as ~975 pC/N. These d33-coefficients were at least three times greater than randomly-oriented BZT ceramics and equally greater than many lead-free piezoelectric ceramics reported in literature. This work successfully demonstrated that grain-oriented BZT ceramics display piezoelectric coefficients (d_(33)-coefficients) that are similar to currently used lead-based materials. This strategy may allow these ceramics to potentially replace some of the lead-based ceramics that are currently being used in various low-temperature and low-drive piezoelectric applications.
机译:Ba(Zr_(0.085)Ti_(0.915))O_3(BZT)陶瓷使用模板化晶粒生长(TGG)工艺以<001>定向进行晶粒定向(纹理化)。当极化并沿<001>纹理化方向测量时,纹理化样品的压电响应得到增强。在低驱动场(<5 kV / cm)下测量的样品的d_(33)系数显示高达975 pC / N的值。这些d33系数至少是随机取向的BZT陶瓷的三倍,也比文献中报道的许多无铅压电陶瓷大三倍。这项工作成功地证明,晶粒取向BZT陶瓷显示出的压电系数(d_(33)系数)与当前使用的铅基材料相似。这种策略可以使这些陶瓷潜在地替代目前在各种低温和低驱动压电应用中使用的某些铅基陶瓷。

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