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首页> 外文期刊>Journal of Colloid and Interface Science >Removal of As(V) by Cu(II)-, Ni(II)-, or Co(II)-doped goethite samples
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Removal of As(V) by Cu(II)-, Ni(II)-, or Co(II)-doped goethite samples

机译:铜(II),镍(II)或钴(II)掺杂针铁矿样品中的砷(V)的去除

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The present study reports removal of As(V) by adsorption onto laboratory-prepared pure and Cu(II)-, Ni(II)-, and Co(II)-doped goethite samples. The X-ray diffraction patterns showed only goethite as the crystalline phase. Doping of ions in the goethite matrix resulted in shift of d-values. Various parameters chosen for adsorption were nature of adsorbent, percentage of doped cations in goethite matrix, contact time, solution pH, and percentage of adsorbate. It was observed that the pH(pzc) of the goethite surface depended on the nature and concentration of metal ions. The surface area as well as the loading capacity increased with the increase of dopant percentage in goethite matrix. A maximum loading capacity of 19.55 mg/g was observed for 2.7% Cu(II)-doped goethite. The adsorption kinetics for Ni(II), Co(II) and for undoped goethite attained a quasi-equilibrium state after 30 min with almost negligible adsorption beyond this time. In case of Cu(II)-doped goethite samples, the quasi-equilibrium state for As(V) adsorption was observed after 60 min. At each studied pH condition, it was observed that the percentage of adsorption of As(V) decreased in the order Cu(II)-doped goethite >= Ni(II)-doped goethite > Co(II)-doped goethite > pure goethite. The adsorption followed: Langmuir isotherm, indicating monolayer formation. (c) 2005 Elsevier Inc. All rights reserved.
机译:本研究报告了通过吸附到实验室制备的纯铜和掺杂了铜(II)-,镍(II)-和钴(II)的针铁矿样品中而去除了砷(V)。 X射线衍射图仅显示针铁矿为结晶相。针铁矿基质中离子的掺杂导致d值的偏移。选择用于吸附的各种参数是吸附剂的性质,针铁矿基质中掺杂阳离子的百分比,接触时间,溶液的pH值和被吸附物的百分比。观察到针铁矿表面的pH(pzc)取决于金属离子的性质和浓度。随着针铁矿基体中掺杂物百分比的增加,表面积和负载量均增加。对于2.7%的Cu(II)掺杂针铁矿,观察到最大负载量为19.55 mg / g。 Ni(II),Co(II)和未掺杂针铁矿的吸附动力学在30分钟后达到准平衡状态,超过此时间几乎没有吸附。对于掺杂铜(II)的针铁矿样品,在60分钟后观察到As(V)吸附的准平衡态。在每个研究的pH条件下,观察到As(V)的吸附百分比按Cu(II)掺杂针铁矿> = Ni(II)掺杂针铁矿> Co(II)掺杂针铁矿>纯针铁矿的顺序降低。吸附如下:Langmuir等温线,表明形成单层。 (c)2005 Elsevier Inc.保留所有权利。

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